| |
| 2006 | ||
|---|---|---|
| 1 | EE | V. S. Pershenkov, A. D. Tremasov, V. V. Belyakov, A. U. Razvalyaev, V. S. Mochkin: X-ray ion mobility spectrometer. Microelectronics Reliability 46(2-4): 641-644 (2006) |
| 1 | V. V. Belyakov | [1] |
| 2 | V. S. Mochkin | [1] |
| 3 | V. S. Pershenkov | [1] |
| 4 | A. U. Razvalyaev | [1] |