M. N. Levin

2002
2	EE	V. S. Pershenkov, S. V. Avdeev, A. S. Tsimbalov, M. N. Levin, V. V. Belyakov, D. V. Ivashin, A. Y. Slesarev, A. Y. Bashin, G. I. Zebrev, V. N. Ulimov: Use of preliminary ultraviolet and infrared illumination for diagnostics of MOS and bipolar devices radiation response. Microelectronics Reliability 42(4-5): 797-804 (2002)
2001
1	EE	M. N. Levin, V. R. Gitlin, S. G. Kadmensky, S. S. Ostrouhov, V. S. Pershenkov: X-ray and UV controlled adjustment of MOS VLSI circuits threshold voltages. Microelectronics Reliability 41(2): 185-191 (2001)

Coauthor Index

1	S. V. Avdeev	[2]
2	A. Y. Bashin	[2]
3	V. V. Belyakov	[2]
4	V. R. Gitlin	[1]
5	D. V. Ivashin	[2]
6	S. G. Kadmensky	[1]
7	S. S. Ostrouhov	[1]
8	V. S. Pershenkov	[1] [2]
9	A. Y. Slesarev	[2]
10	A. S. Tsimbalov	[2]
11	V. N. Ulimov	[2]
12	G. I. Zebrev	[2]