2002 | ||
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1 | EE | V. S. Pershenkov, S. V. Avdeev, A. S. Tsimbalov, M. N. Levin, V. V. Belyakov, D. V. Ivashin, A. Y. Slesarev, A. Y. Bashin, G. I. Zebrev, V. N. Ulimov: Use of preliminary ultraviolet and infrared illumination for diagnostics of MOS and bipolar devices radiation response. Microelectronics Reliability 42(4-5): 797-804 (2002) |
1 | S. V. Avdeev | [1] |
2 | A. Y. Bashin | [1] |
3 | V. V. Belyakov | [1] |
4 | D. V. Ivashin | [1] |
5 | M. N. Levin | [1] |
6 | V. S. Pershenkov | [1] |
7 | A. Y. Slesarev | [1] |
8 | A. S. Tsimbalov | [1] |
9 | V. N. Ulimov | [1] |