| 2005 |
|---|
| 3 | EE | Jin-Wook Lee,
Gyoung Ho Buh,
Guk-Hyon Yon,
Tai-su Park,
Yu Gyun Shin,
U-In Chung,
Joo Tae Moon:
Elimination of surface state induced edge transistors in high voltage NMOSFETs for flash memory devices.
Microelectronics Reliability 45(9-11): 1394-1397 (2005) |
| 2003 |
|---|
| 2 | EE | Young Pil Kim,
U-In Chung,
Joo Tae Moon,
Sang U. Kim:
Electrical analysis of DRAM cell transistors for the root-cause addressing of the tRDL time-delay failure.
Microelectronics Reliability 43(9-11): 1461-1464 (2003) |
| 2001 |
|---|
| 1 | | Young Pil Kim,
Beom Jun Jin,
Young Wook Park,
Joo Tae Moon,
Sang U. Kim:
Analysis of retention tail distribution induced by scaled shallow trench isolation for high densityDRAMs.
Microelectronics Reliability 41(9-10): 1301-1305 (2001) |
