Sang U. Kim

List of publications from the DBLP Bibliography Server - FAQ

2003

2 EE Young Pil Kim, U-In Chung, Joo Tae Moon, Sang U. Kim: Electrical analysis of DRAM cell transistors for the root-cause addressing of the tRDL time-delay failure. Microelectronics Reliability 43(9-11): 1461-1464 (2003)

2001

1 Young Pil Kim, Beom Jun Jin, Young Wook Park, Joo Tae Moon, Sang U. Kim: Analysis of retention tail distribution induced by scaled shallow trench isolation for high densityDRAMs. Microelectronics Reliability 41(9-10): 1301-1305 (2001)

2003
2	EE	Young Pil Kim, U-In Chung, Joo Tae Moon, Sang U. Kim: Electrical analysis of DRAM cell transistors for the root-cause addressing of the tRDL time-delay failure. Microelectronics Reliability 43(9-11): 1461-1464 (2003)
2001
1		Young Pil Kim, Beom Jun Jin, Young Wook Park, Joo Tae Moon, Sang U. Kim: Analysis of retention tail distribution induced by scaled shallow trench isolation for high densityDRAMs. Microelectronics Reliability 41(9-10): 1301-1305 (2001)

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