| |
| 2005 | ||
|---|---|---|
| 2 | EE | Jin-Wook Lee, Gyoung Ho Buh, Guk-Hyon Yon, Tai-su Park, Yu Gyun Shin, U-In Chung, Joo Tae Moon: Elimination of surface state induced edge transistors in high voltage NMOSFETs for flash memory devices. Microelectronics Reliability 45(9-11): 1394-1397 (2005) |
| 2003 | ||
| 1 | EE | Young Pil Kim, U-In Chung, Joo Tae Moon, Sang U. Kim: Electrical analysis of DRAM cell transistors for the root-cause addressing of the tRDL time-delay failure. Microelectronics Reliability 43(9-11): 1461-1464 (2003) |
| 1 | Gyoung Ho Buh | [2] |
| 2 | Sang U. Kim | [1] |
| 3 | Young Pil Kim | [1] |
| 4 | Jin-Wook Lee | [2] |
| 5 | Joo Tae Moon | [1] [2] |
| 6 | Tai-su Park | [2] |
| 7 | Yu Gyun Shin | [2] |
| 8 | Guk-Hyon Yon | [2] |