| |
| 2003 | ||
|---|---|---|
| 2 | EE | Young Pil Kim, U-In Chung, Joo Tae Moon, Sang U. Kim: Electrical analysis of DRAM cell transistors for the root-cause addressing of the tRDL time-delay failure. Microelectronics Reliability 43(9-11): 1461-1464 (2003) |
| 2001 | ||
| 1 | Young Pil Kim, Beom Jun Jin, Young Wook Park, Joo Tae Moon, Sang U. Kim: Analysis of retention tail distribution induced by scaled shallow trench isolation for high densityDRAMs. Microelectronics Reliability 41(9-10): 1301-1305 (2001) | |
| 1 | U-In Chung | [2] |
| 2 | Beom Jun Jin | [1] |
| 3 | Sang U. Kim | [1] [2] |
| 4 | Joo Tae Moon | [1] [2] |
| 5 | Young Wook Park | [1] |