| |
| 2005 | ||
|---|---|---|
| 1 | EE | Jin-Wook Lee, Gyoung Ho Buh, Guk-Hyon Yon, Tai-su Park, Yu Gyun Shin, U-In Chung, Joo Tae Moon: Elimination of surface state induced edge transistors in high voltage NMOSFETs for flash memory devices. Microelectronics Reliability 45(9-11): 1394-1397 (2005) |
| 1 | U-In Chung | [1] |
| 2 | Jin-Wook Lee | [1] |
| 3 | Joo Tae Moon | [1] |
| 4 | Tai-su Park | [1] |
| 5 | Yu Gyun Shin | [1] |
| 6 | Guk-Hyon Yon | [1] |