| |
| 2001 | ||
|---|---|---|
| 1 | Young Pil Kim, Beom Jun Jin, Young Wook Park, Joo Tae Moon, Sang U. Kim: Analysis of retention tail distribution induced by scaled shallow trench isolation for high densityDRAMs. Microelectronics Reliability 41(9-10): 1301-1305 (2001) | |
| 1 | Beom Jun Jin | [1] |
| 2 | Sang U. Kim | [1] |
| 3 | Young Pil Kim | [1] |
| 4 | Joo Tae Moon | [1] |