| 1991 |
|---|
| 5 | | Jacob Savir,
William H. McAnney,
Salvatore R. Vecchio:
Testing for Coupled Cells in Random-Access Memories.
IEEE Trans. Computers 40(10): 1177-1180 (1991) |
| 1989 |
|---|
| 4 | | Jacob Savir,
William H. McAnney,
Salvatore R. Vecchio:
Testing for Coupled Cells in Random-Access Memories.
ITC 1989: 439-451 |
| 1987 |
|---|
| 3 | | Jacob Savir,
William H. McAnney,
Salvatore R. Vecchio:
Fault Propagation Through Embedded Multiport Memories.
IEEE Trans. Computers 36(5): 592-602 (1987) |
| 1985 |
|---|
| 2 | | Jacob Savir,
William H. McAnney,
Salvatore R. Vecchio:
Random Pattern Testing for Data-Line Faults in an Embedded Multiport Memory.
ITC 1985: 100-105 |
| 1 | | Jacob Savir,
William H. McAnney,
Salvatore R. Vecchio:
Random Pattern Testing for Address-Line Faults in an Embedded Multiport Memory.
ITC 1985: 106-114 |
