J. C. Martin

2006
2	EE	A. Benmansour, S. Azzopardi, J. C. Martin, E. Woirgard: Failure mechanism of trench IGBT under short-circuit after turn-off. Microelectronics Reliability 46(9-11): 1778-1783 (2006)
2003
1	EE	J. C. Martin, C. Maneux, N. Labat, A. Touboul, Muriel Riet, S. Blayac, M. Kahn, Jean Godin: 1/f noise analysis of InP/InGaAs DHBTs submitted to bias and thermal stresses. Microelectronics Reliability 43(9-11): 1725-1730 (2003)

Coauthor Index

1	S. Azzopardi	[2]
2	A. Benmansour	[2]
3	S. Blayac	[1]
4	Jean Godin	[1]
5	M. Kahn	[1]
6	N. Labat	[1]
7	C. Maneux	[1]
8	Muriel Riet	[1]
9	A. Touboul	[1]
10	E. Woirgard	[2]

Colors in the list of coauthors