| |
| 2006 | ||
|---|---|---|
| 2 | EE | A. Benmansour, S. Azzopardi, J. C. Martin, E. Woirgard: Failure mechanism of trench IGBT under short-circuit after turn-off. Microelectronics Reliability 46(9-11): 1778-1783 (2006) |
| 2005 | ||
| 1 | EE | S. Azzopardi, A. Benmansour, M. Ishiko, E. Woirgard: Assessment of the Trench IGBT reliability: low temperature experimental characterization. Microelectronics Reliability 45(9-11): 1700-1705 (2005) |
| 1 | S. Azzopardi | [1] [2] |
| 2 | M. Ishiko | [1] |
| 3 | J. C. Martin | [2] |
| 4 | E. Woirgard | [1] [2] |