| 2003 |
|---|
| 2 | EE | J. C. Martin,
C. Maneux,
N. Labat,
A. Touboul,
Muriel Riet,
S. Blayac,
M. Kahn,
Jean Godin:
1/f noise analysis of InP/InGaAs DHBTs submitted to bias and thermal stresses.
Microelectronics Reliability 43(9-11): 1725-1730 (2003) |
| 1998 |
|---|
| 1 | EE | Richard P. Brent,
L. Grosz,
David L. Harrar II,
Markus Hegland,
M. Kahn,
G. Keating,
G. Mercer,
Ole Møller Nielsen,
Michael R. Osborne,
Bing Bing Zhou,
M. Nakanishi:
Development of a Mathematical Subroutine Library for Fujitsu Vector Parallel Processors.
International Conference on Supercomputing 1998: 13-20 |
