| |
| 2003 | ||
|---|---|---|
| 2 | EE | J. C. Martin, C. Maneux, N. Labat, A. Touboul, Muriel Riet, S. Blayac, M. Kahn, Jean Godin: 1/f noise analysis of InP/InGaAs DHBTs submitted to bias and thermal stresses. Microelectronics Reliability 43(9-11): 1725-1730 (2003) |
| 1 | EE | M. Belhaj, C. Maneux, N. Labat, A. Touboul, P. Bove: High current effects in InP/GaAsSb/InP DHBT: Physical mechanisms and parasitic effects. Microelectronics Reliability 43(9-11): 1731-1736 (2003) |
| 1 | M. Belhaj | [1] |
| 2 | S. Blayac | [2] |
| 3 | P. Bove | [1] |
| 4 | Jean Godin | [2] |
| 5 | M. Kahn | [2] |
| 6 | N. Labat | [1] [2] |
| 7 | J. C. Martin | [2] |
| 8 | Muriel Riet | [2] |
| 9 | A. Touboul | [1] [2] |