2007 |
11 | EE | Pabitra Mohan Khilar,
S. Mahapatra:
Intermittent Fault Diagnosis in Wireless Sensor Networks.
ICIT 2007: 145-147 |
10 | EE | Pabitra Mohan Khilar,
S. Mahapatra:
A Distributed Diagnosis Approach to Fault Tolerant Multi-rate Real-Time Embedded Systems.
ICIT 2007: 167-172 |
9 | EE | N. K. Kamila,
S. Mahapatra,
S. Nanda:
Retraction notice to "Invariance image analysis using modified Zernike moments" [Pattern Recognition Lett. 26 (2005) 747-753].
Pattern Recognition Letters 28(13): 1852 (2007) |
2006 |
8 | EE | Pabitra Mohan Khilar,
S. Mahapatra:
Design and Evaluation of a Distributed Diagnosis Algorithm in Dynamic Fault Environments For Not-Completely Connected Network.
ICIT 2006: 81-82 |
7 | EE | T. S. Venkatesan,
K. Deepika,
S. Mahapatra:
The Jahn-Teller and pseudo-Jahn-Teller effects in the anion photoelectron spectroscopy of B3 cluster.
Journal of Computational Chemistry 27(10): 1093-1100 (2006) |
2005 |
6 | EE | S. Mahapatra,
Kuldeep Singh:
A Parallel Scheme for Implementing Multialphabet Arithmetic Coding in High-Speed Programmable Hardware.
ITCC (1) 2005: 79-84 |
5 | EE | M. A. Alam,
S. Mahapatra:
A comprehensive model of PMOS NBTI degradation.
Microelectronics Reliability 45(1): 71-81 (2005) |
4 | EE | N. K. Kamila,
S. Mahapatra,
S. Nanda:
Invariance image analysis using modified Zernike moments.
Pattern Recognition Letters 26(6): 747-753 (2005) |
2003 |
3 | EE | S. Mahapatra,
S. Shukuri,
Jeff Bude:
Substrate Bias Effect on Cycling Induced Performance Degradation of Flash EEPROMs.
VLSI Design 2003: 223-226 |
2001 |
2 | EE | G. Shrivastav,
S. Mahapatra,
V. Ramgopal Rao,
J. Vasi,
K. G. Anil,
C. Fink,
Walter Hansch,
I. Eisele:
erformance Optimization Of 60 Nm Channel Length Vertical Mosfets Using Channel Engineering.
VLSI Design 2001: 475-478 |
1 | EE | A. Kumar,
S. Mahapatra,
R. Lal,
V. R. Rao:
Multi-frequency transconductance technique for interface characterization of deep sub-micron SOI-MOSFETs.
Microelectronics Reliability 41(7): 1049-1051 (2001) |