2002 |
3 | EE | R. Lal,
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VLSI Design 2002: 24-25 |
2001 |
2 | EE | A. Kumar,
S. Mahapatra,
R. Lal,
V. R. Rao:
Multi-frequency transconductance technique for interface characterization of deep sub-micron SOI-MOSFETs.
Microelectronics Reliability 41(7): 1049-1051 (2001) |
1987 |
1 | | R. Lal,
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Queueing Syst. 2(2): 147-172 (1987) |