2009 |
10 | EE | Ayhan A. Mutlu,
Jiayong Le,
Ruben Molina,
Mustafa Celik:
Parametric analysis to determine accurate interconnect extraction corners for design performance.
ISQED 2009: 419-423 |
2008 |
9 | EE | Xin Li,
Jiayong Le,
Mustafa Celik,
Lawrence T. Pileggi:
Defining Statistical Timing Sensitivity for Logic Circuits With Large-Scale Process and Environmental Variations.
IEEE Trans. on CAD of Integrated Circuits and Systems 27(6): 1041-1054 (2008) |
2007 |
8 | EE | Xin Li,
Jiayong Le,
Padmini Gopalakrishnan,
Lawrence T. Pileggi:
Asymptotic Probability Extraction for Nonnormal Performance Distributions.
IEEE Trans. on CAD of Integrated Circuits and Systems 26(1): 16-37 (2007) |
2006 |
7 | EE | Xin Li,
Jiayong Le,
Lawrence T. Pileggi:
Projection-based statistical analysis of full-chip leakage power with non-log-normal distributions.
DAC 2006: 103-108 |
6 | EE | Xin Li,
Jiayong Le,
Lawrence T. Pileggi:
Statistical Performance Modeling and Optimization.
Foundations and Trends in Electronic Design Automation 1(4): (2006) |
2005 |
5 | | Xin Li,
Jiayong Le,
Lawrence T. Pileggi,
Andrzej J. Strojwas:
Projection-based performance modeling for inter/intra-die variations.
ICCAD 2005: 721-727 |
4 | | Xin Li,
Jiayong Le,
Mustafa Celik,
Lawrence T. Pileggi:
Defining statistical sensitivity for timing optimization of logic circuits with large-scale process and environmental variations.
ICCAD 2005: 844-851 |
2004 |
3 | EE | Jiayong Le,
Xin Li,
Lawrence T. Pileggi:
STAC: statistical timing analysis with correlation.
DAC 2004: 343-348 |
2 | EE | Xin Li,
Jiayong Le,
Padmini Gopalakrishnan,
Lawrence T. Pileggi:
Asymptotic probability extraction for non-normal distributions of circuit performance.
ICCAD 2004: 2-9 |
2003 |
1 | EE | Jiayong Le,
Lawrence T. Pileggi,
Anirudh Devgan:
Circuit Simulation of Nanotechnology Devices with Non-monotonic I-V Characteristics.
ICCAD 2003: 491-496 |