| |
| 2002 | ||
|---|---|---|
| 1 | EE | N. Labat, N. Malbert, B. Lambert, A. Touboul, F. Garat, B. Proust: Degradation mechanisms induced by thermal and bias stresses in InP HEMTs. Microelectronics Reliability 42(9-11): 1575-1580 (2002) |
| 1 | N. Labat | [1] |
| 2 | B. Lambert | [1] |
| 3 | N. Malbert | [1] |
| 4 | B. Proust | [1] |
| 5 | A. Touboul | [1] |