| 2005 |
|---|
| 5 | EE | John Kibarian:
Enabling True Design for Manufacturability.
ISQED 2005: 15 |
| 4 | EE | Juan Antonio Carballo,
Yervant Zorian,
Raul Camposano,
Andrzej J. Strojwas,
John Kibarian,
Dennis Wassung,
Alex Alexanian,
Steve Wigley,
Neil Kelly:
Guest Editors' Introduction: DFM Drives Changes in Design Flow.
IEEE Design & Test of Computers 22(3): 200-205 (2005) |
| 2004 |
|---|
| 3 | EE | Andreas J. Strojwas,
Michael Campbell,
Vassilios Gerousis,
Jim Hogan,
John Kibarian,
Marc Levitt,
Walter Ng,
Dipu Pramanik,
Mark Templeton:
When IC yield missed the target, who is at fault?
DAC 2004: 80 |
| 2002 |
|---|
| 2 | EE | Robert W. Brodersen,
Anthony M. Hill,
John Kibarian,
Desmond Kirkpatrick,
Mark A. Lavin,
Mitsumasa Koyanagi:
Nanometer design: what hurts next...?
DAC 2002: 242 |
| 2000 |
|---|
| 1 | EE | John Kibarian:
Ramping New IC Products in the Deep Submicron Age.
ISQED 2000: 29- |
