Neil Kelly

2005
2	EE	Juan Antonio Carballo, Yervant Zorian, Raul Camposano, Andrzej J. Strojwas, John Kibarian, Dennis Wassung, Alex Alexanian, Steve Wigley, Neil Kelly: Guest Editors' Introduction: DFM Drives Changes in Design Flow. IEEE Design & Test of Computers 22(3): 200-205 (2005)
1998
1	EE	Neil Kelly: BIST vs. ATE for testing system-on-a-chip. ITC 1998: 1147

Coauthor Index

1	Alex Alexanian	[2]
2	Raul Camposano	[2]
3	Juan Antonio Carballo	[2]
4	John Kibarian	[2]
5	Andrzej J. Strojwas	[2]
6	Dennis Wassung	[2]
7	Steve Wigley	[2]
8	Yervant Zorian	[2]