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Neil Kelly

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2005
2EEJuan Antonio Carballo, Yervant Zorian, Raul Camposano, Andrzej J. Strojwas, John Kibarian, Dennis Wassung, Alex Alexanian, Steve Wigley, Neil Kelly: Guest Editors' Introduction: DFM Drives Changes in Design Flow. IEEE Design & Test of Computers 22(3): 200-205 (2005)
1998
1EENeil Kelly: BIST vs. ATE for testing system-on-a-chip. ITC 1998: 1147

Coauthor Index

1Alex Alexanian [2]
2Raul Camposano [2]
3Juan Antonio Carballo [2]
4John Kibarian [2]
5Andrzej J. Strojwas [2]
6Dennis Wassung [2]
7Steve Wigley [2]
8Yervant Zorian [2]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)