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Domenico Caputo

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2005
3EEFernanda Irrera, Giuseppina Puzzilli, Domenico Caputo: A comprehensive model for oxide degradation. Microelectronics Reliability 45(5-6): 853-856 (2005)
2004
2EEDomenico Caputo, Fernanda Irrera: On the reliability of ZrO2 films for VLSI applications. Microelectronics Reliability 44(5): 739-745 (2004)
2002
1EEDomenico Caputo, Fernanda Irrera: Investigation and modeling of stressed thermal oxides. Microelectronics Reliability 42(3): 327-333 (2002)

Coauthor Index

1Fernanda Irrera [1] [2] [3]
2Giuseppina Puzzilli [3]

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