| |
| 2005 | ||
|---|---|---|
| 3 | EE | Fernanda Irrera, Giuseppina Puzzilli, Domenico Caputo: A comprehensive model for oxide degradation. Microelectronics Reliability 45(5-6): 853-856 (2005) |
| 2004 | ||
| 2 | EE | Domenico Caputo, Fernanda Irrera: On the reliability of ZrO2 films for VLSI applications. Microelectronics Reliability 44(5): 739-745 (2004) |
| 2002 | ||
| 1 | EE | Domenico Caputo, Fernanda Irrera: Investigation and modeling of stressed thermal oxides. Microelectronics Reliability 42(3): 327-333 (2002) |
| 1 | Fernanda Irrera | [1] [2] [3] |
| 2 | Giuseppina Puzzilli | [3] |