| |
| 2005 | ||
|---|---|---|
| 2 | EE | Fernanda Irrera, Giuseppina Puzzilli, Domenico Caputo: A comprehensive model for oxide degradation. Microelectronics Reliability 45(5-6): 853-856 (2005) |
| 1 | EE | Fernanda Irrera, Giuseppina Puzzilli: Crested barrier in the tunnel stack of non-volatile memories. Microelectronics Reliability 45(5-6): 907-910 (2005) |
| 1 | Domenico Caputo | [2] |
| 2 | Fernanda Irrera | [1] [2] |