Takeshi Asakawa

2003
3	EE	Takeshi Asakawa, Kazuhiko Iwasaki, Seiji Kajihara: BIST-oriented test pattern generator for detection of transition faults. Systems and Computers in Japan 34(3): 76-84 (2003)
2001
2	EE	Kenichi Ichino, Takeshi Asakawa, Satoshi Fukumoto, Kazuhiko Iwasaki, Seiji Kajihara: Hybrid BIST Using Partially Rotational Scan. Asian Test Symposium 2001: 379-384
1	EE	Takeshi Asakawa, Kazuhiko Iwasaki: Using ATPG vectors for BIST test pattern generator. Systems and Computers in Japan 32(11): 1-8 (2001)

Coauthor Index

1	Satoshi Fukumoto	[2]
2	Kenichi Ichino	[2]
3	Kazuhiko Iwasaki	[1] [2] [3]
4	Seiji Kajihara	[2] [3]