| |
| 2003 | ||
|---|---|---|
| 1 | EE | Yuki Yamagata, Kenichi Ichino, Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Masayuki Satoh, Hiroyuki Itabashi, Takashi Murai, Nobuyuki Otsuka: Implementation of Memory Tester Consisting of SRAM-Based Reconfigurable Cells. Asian Test Symposium 2003: 28-31 |
| 1 | Masayuki Arai | [1] |
| 2 | Satoshi Fukumoto | [1] |
| 3 | Kenichi Ichino | [1] |
| 4 | Hiroyuki Itabashi | [1] |
| 5 | Kazuhiko Iwasaki | [1] |
| 6 | Nobuyuki Otsuka | [1] |
| 7 | Masayuki Satoh | [1] |
| 8 | Yuki Yamagata | [1] |