2003 | ||
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1 | EE | Yuki Yamagata, Kenichi Ichino, Masayuki Arai, Satoshi Fukumoto, Kazuhiko Iwasaki, Masayuki Satoh, Hiroyuki Itabashi, Takashi Murai, Nobuyuki Otsuka: Implementation of Memory Tester Consisting of SRAM-Based Reconfigurable Cells. Asian Test Symposium 2003: 28-31 |
1 | Masayuki Arai | [1] |
2 | Satoshi Fukumoto | [1] |
3 | Kenichi Ichino | [1] |
4 | Kazuhiko Iwasaki | [1] |
5 | Takashi Murai | [1] |
6 | Nobuyuki Otsuka | [1] |
7 | Masayuki Satoh | [1] |
8 | Yuki Yamagata | [1] |