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S. Hidalgo

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2005
6EEI. Cortés, J. Roig, D. Flores, J. Urresti, S. Hidalgo, J. Rebollo: Analysis of hot-carrier degradation in a SOI LDMOS transistor with a steep retrograde drift doping profile. Microelectronics Reliability 45(3-4): 493-498 (2005)
5EEJ. Urresti, S. Hidalgo, D. Flores, J. Roig, I. Cortés, J. Rebollo: Lateral punch-through TVS devices for on-chip protection in low-voltage applications. Microelectronics Reliability 45(7-8): 1181-1186 (2005)
2004
4EEM. Vellvehí, D. Flores, X. Jordà, S. Hidalgo, J. Rebollo, L. Coulbeck, P. Waind: Design considerations for 6.5 kV IGBT devices. Microelectronics Journal 35(3): 269-275 (2004)
3EEJ. Roig, D. Flores, S. Hidalgo, J. Rebollo, J. Millán: Thin-film silicon-on-sapphire LDMOS structures for RF power amplifier applications. Microelectronics Journal 35(3): 291-297 (2004)
2003
2EEJ. Urresti, S. Hidalgo, D. Flores, J. Roig, J. Rebollo, I. Mazarredo: Optimisation of very low voltage TVS protection devices. Microelectronics Journal 34(9): 809-813 (2003)
1EES. Hidalgo, D. Flores, I. Obieta, I. Mazarredo: Passivation and packaging of positive bevelled edge termination and related electrical stability. Microelectronics Reliability 43(3): 413-420 (2003)

Coauthor Index

1I. Cortés [5] [6]
2L. Coulbeck [4]
3D. Flores [1] [2] [3] [4] [5] [6]
4X. Jordà [4]
5I. Mazarredo [1] [2]
6J. Millán [3]
7I. Obieta [1]
8J. Rebollo [2] [3] [4] [5] [6]
9J. Roig [2] [3] [5] [6]
10J. Urresti [2] [5] [6]
11M. Vellvehí [4]
12P. Waind [4]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)