I. Cortés

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2005

2 EE I. Cortés, J. Roig, D. Flores, J. Urresti, S. Hidalgo, J. Rebollo: Analysis of hot-carrier degradation in a SOI LDMOS transistor with a steep retrograde drift doping profile. Microelectronics Reliability 45(3-4): 493-498 (2005)

1 EE J. Urresti, S. Hidalgo, D. Flores, J. Roig, I. Cortés, J. Rebollo: Lateral punch-through TVS devices for on-chip protection in low-voltage applications. Microelectronics Reliability 45(7-8): 1181-1186 (2005)

2005
2	EE	I. Cortés, J. Roig, D. Flores, J. Urresti, S. Hidalgo, J. Rebollo: Analysis of hot-carrier degradation in a SOI LDMOS transistor with a steep retrograde drift doping profile. Microelectronics Reliability 45(3-4): 493-498 (2005)
1	EE	J. Urresti, S. Hidalgo, D. Flores, J. Roig, I. Cortés, J. Rebollo: Lateral punch-through TVS devices for on-chip protection in low-voltage applications. Microelectronics Reliability 45(7-8): 1181-1186 (2005)

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