2005 |
3 | EE | I. Cortés,
J. Roig,
D. Flores,
J. Urresti,
S. Hidalgo,
J. Rebollo:
Analysis of hot-carrier degradation in a SOI LDMOS transistor with a steep retrograde drift doping profile.
Microelectronics Reliability 45(3-4): 493-498 (2005) |
2 | EE | J. Urresti,
S. Hidalgo,
D. Flores,
J. Roig,
I. Cortés,
J. Rebollo:
Lateral punch-through TVS devices for on-chip protection in low-voltage applications.
Microelectronics Reliability 45(7-8): 1181-1186 (2005) |
2003 |
1 | EE | J. Urresti,
S. Hidalgo,
D. Flores,
J. Roig,
J. Rebollo,
I. Mazarredo:
Optimisation of very low voltage TVS protection devices.
Microelectronics Journal 34(9): 809-813 (2003) |