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J. Urresti

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2005
3EEI. Cortés, J. Roig, D. Flores, J. Urresti, S. Hidalgo, J. Rebollo: Analysis of hot-carrier degradation in a SOI LDMOS transistor with a steep retrograde drift doping profile. Microelectronics Reliability 45(3-4): 493-498 (2005)
2EEJ. Urresti, S. Hidalgo, D. Flores, J. Roig, I. Cortés, J. Rebollo: Lateral punch-through TVS devices for on-chip protection in low-voltage applications. Microelectronics Reliability 45(7-8): 1181-1186 (2005)
2003
1EEJ. Urresti, S. Hidalgo, D. Flores, J. Roig, J. Rebollo, I. Mazarredo: Optimisation of very low voltage TVS protection devices. Microelectronics Journal 34(9): 809-813 (2003)

Coauthor Index

1I. Cortés [2] [3]
2D. Flores [1] [2] [3]
3S. Hidalgo [1] [2] [3]
4I. Mazarredo [1]
5J. Rebollo [1] [2] [3]
6J. Roig [1] [2] [3]

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