| |
| 2003 | ||
|---|---|---|
| 1 | EE | S. Hidalgo, D. Flores, I. Obieta, I. Mazarredo: Passivation and packaging of positive bevelled edge termination and related electrical stability. Microelectronics Reliability 43(3): 413-420 (2003) |
| 1 | D. Flores | [1] |
| 2 | S. Hidalgo | [1] |
| 3 | I. Mazarredo | [1] |