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Evgeni P. Gusev

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2006
5EEHuiling Shang, Martin M. Frank, Evgeni P. Gusev, Jack O. Chu, Stephen W. Bedell, Kathryn W. Guarini, Mei-Kei Ieong: Germanium channel MOSFETs: Opportunities and challenges. IBM Journal of Research and Development 50(4-5): 377-386 (2006)
4EEEvgeni P. Gusev, Vijay Narayanan, Martin M. Frank: Advanced high-k dielectric stacks with polySi and metal gates: Recent progress and current challenges. IBM Journal of Research and Development 50(4-5): 387-410 (2006)
2005
3EEJ.-P. Han, S. M. Koo, E. M. Vogel, Evgeni P. Gusev, C. D'Emic, C. A. Richter, J. S. Suehle: Reverse short channel effects in high-k gated nMOSFETs. Microelectronics Reliability 45(5-6): 783-785 (2005)
2004
2EEJ. A. Felix, J. R. Schwank, D. M. Fleetwood, M. R. Shaneyfelt, Evgeni P. Gusev: Effects of radiation and charge trapping on the reliability of high-kappa gate dielectrics. Microelectronics Reliability 44(4): 563-575 (2004)
1999
1EEEvgeni P. Gusev, Hsu-Chang Lu, Eric L. Garfunkel, Torgny Gustafsson, Martin L. Green: Growth and characterization of ultrathin nitrided silicon oxide films. IBM Journal of Research and Development 43(3): 265-286 (1999)

Coauthor Index

1Stephen W. Bedell [5]
2Jack O. Chu [5]
3C. D'Emic [3]
4J. A. Felix [2]
5D. M. Fleetwood [2]
6Martin M. Frank [4] [5]
7Eric L. Garfunkel [1]
8Martin L. Green [1]
9Kathryn W. Guarini [5]
10Torgny Gustafsson [1]
11J.-P. Han [3]
12Mei-Kei Ieong [5]
13S. M. Koo [3]
14Hsu-Chang Lu [1]
15Vijay Narayanan [4]
16C. A. Richter [3]
17J. R. Schwank [2]
18M. R. Shaneyfelt [2]
19Huiling Shang [5]
20J. S. Suehle [3]
21E. M. Vogel [3]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)