| 2006 |
|---|
| 5 | EE | Huiling Shang,
Martin M. Frank,
Evgeni P. Gusev,
Jack O. Chu,
Stephen W. Bedell,
Kathryn W. Guarini,
Mei-Kei Ieong:
Germanium channel MOSFETs: Opportunities and challenges.
IBM Journal of Research and Development 50(4-5): 377-386 (2006) |
| 4 | EE | Evgeni P. Gusev,
Vijay Narayanan,
Martin M. Frank:
Advanced high-k dielectric stacks with polySi and metal gates: Recent progress and current challenges.
IBM Journal of Research and Development 50(4-5): 387-410 (2006) |
| 2005 |
|---|
| 3 | EE | J.-P. Han,
S. M. Koo,
E. M. Vogel,
Evgeni P. Gusev,
C. D'Emic,
C. A. Richter,
J. S. Suehle:
Reverse short channel effects in high-k gated nMOSFETs.
Microelectronics Reliability 45(5-6): 783-785 (2005) |
| 2004 |
|---|
| 2 | EE | J. A. Felix,
J. R. Schwank,
D. M. Fleetwood,
M. R. Shaneyfelt,
Evgeni P. Gusev:
Effects of radiation and charge trapping on the reliability of high-kappa gate dielectrics.
Microelectronics Reliability 44(4): 563-575 (2004) |
| 1999 |
|---|
| 1 | EE | Evgeni P. Gusev,
Hsu-Chang Lu,
Eric L. Garfunkel,
Torgny Gustafsson,
Martin L. Green:
Growth and characterization of ultrathin nitrided silicon oxide films.
IBM Journal of Research and Development 43(3): 265-286 (1999) |
