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| 2005 | ||
|---|---|---|
| 1 | EE | J.-P. Han, S. M. Koo, E. M. Vogel, Evgeni P. Gusev, C. D'Emic, C. A. Richter, J. S. Suehle: Reverse short channel effects in high-k gated nMOSFETs. Microelectronics Reliability 45(5-6): 783-785 (2005) |
| 1 | C. D'Emic | [1] |
| 2 | Evgeni P. Gusev | [1] |
| 3 | J.-P. Han | [1] |
| 4 | S. M. Koo | [1] |
| 5 | J. S. Suehle | [1] |
| 6 | E. M. Vogel | [1] |