| |
| 2004 | ||
|---|---|---|
| 3 | EE | J. A. Felix, J. R. Schwank, D. M. Fleetwood, M. R. Shaneyfelt, Evgeni P. Gusev: Effects of radiation and charge trapping on the reliability of high-kappa gate dielectrics. Microelectronics Reliability 44(4): 563-575 (2004) |
| 2002 | ||
| 2 | EE | D. M. Fleetwood: Effects of hydrogen transport and reactions on microelectronics radiation response and reliability. Microelectronics Reliability 42(4-5): 523-541 (2002) |
| 1 | EE | D. M. Fleetwood: Hydrogen-related reliability issues for advanced microelectronics. Microelectronics Reliability 42(9-11): 1397-1403 (2002) |
| 1 | J. A. Felix | [3] |
| 2 | Evgeni P. Gusev | [3] |
| 3 | J. R. Schwank | [3] |
| 4 | M. R. Shaneyfelt | [3] |