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| 2004 | ||
|---|---|---|
| 1 | EE | J. A. Felix, J. R. Schwank, D. M. Fleetwood, M. R. Shaneyfelt, Evgeni P. Gusev: Effects of radiation and charge trapping on the reliability of high-kappa gate dielectrics. Microelectronics Reliability 44(4): 563-575 (2004) |
| 1 | J. A. Felix | [1] |
| 2 | D. M. Fleetwood | [1] |
| 3 | Evgeni P. Gusev | [1] |
| 4 | M. R. Shaneyfelt | [1] |