C. Cremonesi
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2001
1
EE
N. Galbiati
,
G. Ghidini
, C. Cremonesi,
L. Larcher
: Impact of the As dose in 0.35 mum EEPROM technology: characterization and modeling.
Microelectronics Reliability 41
(7): 999-1002 (2001)
Coauthor
Index
1
N. Galbiati
[
1
]
2
G. Ghidini
[
1
]
3
L. Larcher
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
