1997 |
3 | EE | James Montanaro,
Richard T. Witek,
Krishna Anne,
Andrew J. Black,
Elizabeth M. Cooper,
Daniel W. Dobberpuhl,
Paul M. Donahue,
Jim Eno,
Gregory W. Hoeppner,
David Kruckemyer,
Thomas H. Lee,
Peter C. M. Lin,
Liam Madden,
Daniel Murray,
Mark H. Pearce,
Sribalan Santhanam,
Kathryn J. Snyder,
Ray Stephany,
Stephen C. Thierauf:
A 160-MHz, 32-b, 0.5-W CMOS RISC Microprocessor.
Digital Technical Journal 9(1): (1997) |
1995 |
2 | | John H. Edmondson,
Paul I. Rubinfeld,
Peter J. Bannon,
Bradley J. Benschneider,
Debra Bernstein,
Ruben W. Castelino,
Elizabeth M. Cooper,
Daniel E. Dever,
Dale R. Donchin,
Timothy C. Fischer,
Anil K. Jain,
Shekhar Mehta,
Jeanne E. Meyer,
Ronald P. Preston,
Vidya Rajagopalan,
Chandrasekhara Somanathan,
Scott A. Taylor,
Gilbert M. Wolrich:
Internal Organization of the Alpha 21164, a 300-MHz 64-bit Quad-issue CMOS RISC Microprocessor
Digital Technical Journal 7(1): 0- (1995) |
1985 |
1 | | Matthew Adiletta,
Elizabeth M. Cooper,
Keith Gutfreund:
Automatic Test Generation for Generic Scan Designs.
ITC 1985: 40-44 |