William J. Bowhill

1998
2	EE	Dilip K. Bhavsar, Ugonna Echeruo, David R. Akeson, William J. Bowhill: A highly testable and diagnosable fabrication process test chip. ITC 1998: 853-861
1995
1		William J. Bowhill, Shane L. Bell, Bradley J. Benschneider, Andrew J. Black, Sharon M. Britton, Ruben W. Castelino, Dale R. Donchin, John H. Edmondson, Harry R. Fair III, Paul E. Gronowski, Anil K. Jain, Patricia L. Kroesen, Marc E. Lamere, Bruce J. Loughlin, Shekhar Mehta, Robert O. Mueller, Ronald P. Preston, Sribalan Santhanam, Timothy A. Shedd, Michael J. Smith, Stephen C. Thierauf: Circuit Implementation of a 300-MHz 64-bit Second-generation CMOS Alpha CPU Digital Technical Journal 7(1): 0- (1995)

Coauthor Index

1	David R. Akeson	[2]
2	Shane L. Bell	[1]
3	Bradley J. Benschneider	[1]
4	Dilip K. Bhavsar	[2]
5	Andrew J. Black	[1]
6	Sharon M. Britton	[1]
7	Ruben W. Castelino	[1]
8	Dale R. Donchin	[1]
9	Ugonna Echeruo	[2]
10	John H. Edmondson	[1]
11	Harry R. Fair III	[1]
12	Paul E. Gronowski	[1]
13	Anil K. Jain	[1]
14	Patricia L. Kroesen	[1]
15	Marc E. Lamere	[1]
16	Bruce J. Loughlin	[1]
17	Shekhar Mehta	[1]
18	Robert O. Mueller	[1]
19	Ronald P. Preston	[1]
20	Sribalan Santhanam	[1]
21	Timothy A. Shedd	[1]
22	Michael J. Smith	[1]
23	Stephen C. Thierauf	[1]