| 2000 |
|---|
| 7 | EE | Surendra Bommu,
Srimat T. Chakradhar,
Kiran B. Doreswamy:
Resource-Constrained Compaction of Sequential Circuit Test Sets.
VLSI Design 2000: 398-405 |
| 6 | EE | Surendra Bommu,
Niall O'Neill,
Maciej J. Ciesielski:
Retiming-based factorization for sequential logic optimization.
ACM Trans. Design Autom. Electr. Syst. 5(3): 373-398 (2000) |
| 5 | EE | Surendra Bommu,
Kiran B. Doreswamy,
Srimat T. Chakradhar:
A Practical Vector Restoration Technique for Large Sequential Circuits.
J. Electronic Testing 16(5): 521-539 (2000) |
| 1998 |
|---|
| 4 | EE | Surendra Bommu,
Srimat T. Chakradhar,
Kiran B. Doreswamy:
Vector Restoration Using Accelerated Validation and Refinement.
Asian Test Symposium 1998: 458-466 |
| 3 | EE | Surendra Bommu,
Srimat T. Chakradhar,
Kiran B. Doreswamy:
Static compaction using overlapped restoration and segment pruning.
ICCAD 1998: 140-146 |
| 2 | EE | Surendra Bommu,
Srimat T. Chakradhar,
Kiran B. Doreswamy:
Static test sequence compaction based on segment reordering and accelerated vector restoration.
ITC 1998: 954- |
| 1997 |
|---|
| 1 | EE | Sujit Dey,
Surendra Bommu:
Performance analysis of a system of communicating processes.
ICCAD 1997: 590-597 |
