| |
| 2004 | ||
|---|---|---|
| 2 | EE | M. Dammann, A. Leuther, Rüdiger Quay, M. Meng, H. Konstanzer, W. Jantz, Michael Mikulla: Reliability of 70 nm metamorphic HEMTs. Microelectronics Reliability 44(6): 939-943 (2004) |
| 2002 | ||
| 1 | EE | M. Dammann, F. Benkhelifa, M. Meng, W. Jantz: Reliability of Metamorphic HEMTs for Power Applications. Microelectronics Reliability 42(9-11): 1569-1573 (2002) |
| 1 | F. Benkhelifa | [1] |
| 2 | M. Dammann | [1] [2] |
| 3 | W. Jantz | [1] [2] |
| 4 | H. Konstanzer | [2] |
| 5 | A. Leuther | [2] |
| 6 | Michael Mikulla | [2] |
| 7 | Rüdiger Quay | [2] |