F. Benkhelifa
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2002
1
EE
M. Dammann
, F. Benkhelifa,
M. Meng
,
W. Jantz
: Reliability of Metamorphic HEMTs for Power Applications.
Microelectronics Reliability 42
(9-11): 1569-1573 (2002)
Coauthor
Index
1
M. Dammann
[
1
]
2
W. Jantz
[
1
]
3
M. Meng
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
