| |
| 2004 | ||
|---|---|---|
| 1 | EE | M. Dammann, A. Leuther, Rüdiger Quay, M. Meng, H. Konstanzer, W. Jantz, Michael Mikulla: Reliability of 70 nm metamorphic HEMTs. Microelectronics Reliability 44(6): 939-943 (2004) |
| 1 | M. Dammann | [1] |
| 2 | W. Jantz | [1] |
| 3 | A. Leuther | [1] |
| 4 | M. Meng | [1] |
| 5 | Michael Mikulla | [1] |
| 6 | Rüdiger Quay | [1] |