2007 |
8 | EE | Francine Bacchini,
Greg Spirakis,
Juan Antonio Carballo,
Kurt Keutzer,
Aart J. de Geus,
Fu-Chieh Hsu,
Kazu Yamada:
Megatrends and EDA 2017.
DAC 2007: 21-22 |
7 | EE | Francine Bacchini,
Daniel D. Gajski,
Laurent Maillet-Contoz,
Haruhisa Kashiwagi,
Jack Donovan,
Tommi Mäkeläinen,
Jack Greenbaum,
Rishiyur S. Nikhil:
TLM: Crossing Over From Buzz To Adoption.
DAC 2007: 444-445 |
6 | EE | Francine Bacchini,
Alan J. Hu,
Tom Fitzpatrick,
Rajeev Ranjan,
David Lacey,
Mercedes Tan,
Andrew Piziali,
Avi Ziv:
Verification Coverage: When is Enough, Enough?
DAC 2007: 744-745 |
2005 |
5 | EE | Francine Bacchini,
Jan M. Rabaey,
Allan Cox,
Frank Lane,
Rudy Lauwereins,
Ulrich Ramacher,
David Witt:
Wireless platforms: GOPS for cents and MilliWatts.
DAC 2005: 351-352 |
4 | EE | Francine Bacchini,
Gabe Moretti,
Harry Foster,
Janick Bergeron,
Masayuki Nakamura,
Shrenik Mehta,
Laurent Ducousso:
Is methodology the highway out of verification hell?
DAC 2005: 521-522 |
3 | EE | Francine Bacchini,
David Maliniak,
Terry Doherty,
Peter McShane,
Suhas A. Pai,
Sriram Sundararajan,
Soo-Kwan Eo,
Pascal Urard:
ESL: building the bridge between systems to silicon.
DAC 2005: 69-70 |
2004 |
2 | EE | Francine Bacchini,
Robert F. Damiano,
Bob Bentley,
Kurt Baty,
Kevin Normoyle,
Makoto Ishii,
Einat Yogev:
Verification: what works and what doesn't.
DAC 2004: 274 |
1 | EE | Francine Bacchini,
Pierre G. Paulin,
Reinaldo A. Bergamaschi,
Raj Pawate,
Arie Bernstein,
Ramesh Chandra,
Mohamed Ben-Romdhane:
System level design: six success stories in search of an industry.
DAC 2004: 349-350 |