| |
| 2008 | ||
|---|---|---|
| 5 | EE | Amir Zjajo, José Pineda de Gyvez: Diagnostic Analysis of Static Errors in Multi-Step Analog to Digital Converters. DATE 2008: 74-79 |
| 4 | EE | Amir Zjajo, Shaji Krishnan, José Pineda de Gyvez: Efficient Estimation of Die-Level Process Parameter Variations via the EM-Algorithm. DDECS 2008: 287-292 |
| 3 | EE | Amir Zjajo, José Pineda de Gyvez: Calibration and Debugging of Multi-step Analog to Digital Converters. DELTA 2008: 512-515 |
| 2007 | ||
| 2 | EE | Amir Zjajo, Manuel J. Barragan Asian, José Pineda de Gyvez: Interactive presentation: BIST method for die-level process parameter variation monitoring in analog/mixed-signal integrated circuits. DATE 2007: 1301-1306 |
| 2006 | ||
| 1 | EE | Amir Zjajo, José Pineda de Gyvez, Guido Gronthoud: Structural Fault Modeling and Fault Detection Through Neyman-Pearson Decision Criteria for Analog Integrated Circuits. J. Electronic Testing 22(4-6): 399-409 (2006) |
| 1 | Manuel J. Barragan Asian | [2] |
| 2 | Guido Gronthoud | [1] |
| 3 | José Pineda de Gyvez | [1] [2] [3] [4] [5] |
| 4 | Shaji Krishnan | [4] |