Shaji Krishnan

2008
3	EE	Amir Zjajo, Shaji Krishnan, José Pineda de Gyvez: Efficient Estimation of Die-Level Process Parameter Variations via the EM-Algorithm. DDECS 2008: 287-292
2007
2	EE	Jens Anders, Shaji Krishnan, Guido Gronthoud: Re-configuration of sub-blocks for effective application of time domain tests. DATE 2007: 707-712
1	EE	Shaji Krishnan, Rene Jonker, Leon van de Logt: Variance Reduction for Supply Ramp Based Cheap RF Test Alternatives. European Test Symposium 2007: 55-62

Coauthor Index

1	Jens Anders	[2]
2	Guido Gronthoud	[2]
3	José Pineda de Gyvez	[3]
4	Rene Jonker	[1]
5	Leon van de Logt	[1]
6	Amir Zjajo	[3]

Colors in the list of coauthors