| |
| 2002 | ||
|---|---|---|
| 1 | EE | F. Zängl, Harald Gossner, K. Esmark, R. Owen, G. Zimmermann: Case study of a technology transfer causing ESD problems. Microelectronics Reliability 42(9-11): 1275-1280 (2002) |
| 1 | K. Esmark | [1] |
| 2 | Harald Gossner | [1] |
| 3 | F. Zängl | [1] |
| 4 | G. Zimmermann | [1] |