| |
| 2006 | ||
|---|---|---|
| 3 | EE | Kenneth L. Shepard, Daniel N. Maynard: Variability and yield improvement: rules, models, and characterization. ICCAD 2006: 834-835 |
| 2003 | ||
| 2 | EE | Mary Y. L. Wisniewski, Emmanuel Yashchin, Robert L. Franch, David P. Conrady, Daniel N. Maynard, Giovanni Fiorenza, I. Cevdet Noyan: The physical design of on-chip interconnections. IEEE Trans. on CAD of Integrated Circuits and Systems 22(3): 254-276 (2003) |
| 2002 | ||
| 1 | EE | Daniel N. Maynard: Productivity Optimization Techniques for the Proactive Semiconductor Manufacturer (invited). ISQED 2002: 189 |
| 1 | David P. Conrady | [2] |
| 2 | Giovanni Fiorenza | [2] |
| 3 | Robert L. Franch | [2] |
| 4 | I. Cevdet Noyan | [2] |
| 5 | Kenneth L. Shepard | [3] |
| 6 | Mary Y. L. Wisniewski | [2] |
| 7 | Emmanuel Yashchin | [2] |