Kenneth Wu

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3 Kimberle Koile, Kevin Chevalier, Michel Rbeiz, Adam Rogal, David Singer, Jordan Sorensen, Amanda Smith, Kah Seng Tay, Kenneth Wu: Supporting Feedback and Assessment of Digital Ink Answers to In-Class Exercises. AAAI 2007: 1787-1794
2EERobin C. J. Wang, C. C. Lee, L. D. Chen, Kenneth Wu, K. S. Chang-Liao: A study of Cu/Low-k stress-induced voiding at via bottom and its microstructure effect. Microelectronics Reliability 46(9-11): 1673-1678 (2006)
1EELing-Chang Hu, An-Chi Kang, Eric Chen, J. R. Shih, Yao-Feng Lin, Kenneth Wu, Ya-Chin King: Gate stress effect on low temperature data retention characteristics of split-gate flash memories. Microelectronics Reliability 45(9-11): 1331-1336 (2005)

Coauthor Index

1K. S. Chang-Liao [2]
2Eric Chen [1]
3L. D. Chen [2]
4Kevin Chevalier [3]
5Ling-Chang Hu [1]
6An-Chi Kang [1]
7Ya-Chin King [1]
8Kimberle Koile [3]
9C. C. Lee [2]
10Yao-Feng Lin [1]
11Michel Rbeiz [3]
12Adam Rogal [3]
13J. R. Shih [1]
14David Singer [3]
15Amanda Smith [3]
16Jordan Sorensen [3]
17Kah Seng Tay [3]
18Robin C. J. Wang [2]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)