2007 |
3 | | Kimberle Koile,
Kevin Chevalier,
Michel Rbeiz,
Adam Rogal,
David Singer,
Jordan Sorensen,
Amanda Smith,
Kah Seng Tay,
Kenneth Wu:
Supporting Feedback and Assessment of Digital Ink Answers to In-Class Exercises.
AAAI 2007: 1787-1794 |
2006 |
2 | EE | Robin C. J. Wang,
C. C. Lee,
L. D. Chen,
Kenneth Wu,
K. S. Chang-Liao:
A study of Cu/Low-k stress-induced voiding at via bottom and its microstructure effect.
Microelectronics Reliability 46(9-11): 1673-1678 (2006) |
2005 |
1 | EE | Ling-Chang Hu,
An-Chi Kang,
Eric Chen,
J. R. Shih,
Yao-Feng Lin,
Kenneth Wu,
Ya-Chin King:
Gate stress effect on low temperature data retention characteristics of split-gate flash memories.
Microelectronics Reliability 45(9-11): 1331-1336 (2005) |