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2005 | ||
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2 | EE | Ling-Chang Hu, An-Chi Kang, Eric Chen, J. R. Shih, Yao-Feng Lin, Kenneth Wu, Ya-Chin King: Gate stress effect on low temperature data retention characteristics of split-gate flash memories. Microelectronics Reliability 45(9-11): 1331-1336 (2005) |
1997 | ||
1 | EE | Michael F. Cohen, Marc Levoy, Jitendra Malik, Leonard McMillan, Eric Chen: Image-based rendering: really new or déjà vu? (panel). SIGGRAPH 1997: 468-470 |
1 | Michael F. Cohen | [1] |
2 | Ling-Chang Hu | [2] |
3 | An-Chi Kang | [2] |
4 | Ya-Chin King | [2] |
5 | Marc Levoy | [1] |
6 | Yao-Feng Lin | [2] |
7 | Jitendra Malik | [1] |
8 | Leonard McMillan | [1] |
9 | J. R. Shih | [2] |
10 | Kenneth Wu | [2] |