| |
| 2005 | ||
|---|---|---|
| 1 | EE | Ling-Chang Hu, An-Chi Kang, Eric Chen, J. R. Shih, Yao-Feng Lin, Kenneth Wu, Ya-Chin King: Gate stress effect on low temperature data retention characteristics of split-gate flash memories. Microelectronics Reliability 45(9-11): 1331-1336 (2005) |
| 1 | Eric Chen | [1] |
| 2 | An-Chi Kang | [1] |
| 3 | Ya-Chin King | [1] |
| 4 | Yao-Feng Lin | [1] |
| 5 | J. R. Shih | [1] |
| 6 | Kenneth Wu | [1] |