An-Chi Kang

2005
1	EE	Ling-Chang Hu, An-Chi Kang, Eric Chen, J. R. Shih, Yao-Feng Lin, Kenneth Wu, Ya-Chin King: Gate stress effect on low temperature data retention characteristics of split-gate flash memories. Microelectronics Reliability 45(9-11): 1331-1336 (2005)

Coauthor Index

1	Eric Chen	[1]
2	Ling-Chang Hu	[1]
3	Ya-Chin King	[1]
4	Yao-Feng Lin	[1]
5	J. R. Shih	[1]
6	Kenneth Wu	[1]