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J. R. Shih

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2005
1EELing-Chang Hu, An-Chi Kang, Eric Chen, J. R. Shih, Yao-Feng Lin, Kenneth Wu, Ya-Chin King: Gate stress effect on low temperature data retention characteristics of split-gate flash memories. Microelectronics Reliability 45(9-11): 1331-1336 (2005)

Coauthor Index

1Eric Chen [1]
2Ling-Chang Hu [1]
3An-Chi Kang [1]
4Ya-Chin King [1]
5Yao-Feng Lin [1]
6Kenneth Wu [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)